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USB 3.1 设计和测试中的主要挑战
•Transmitter SSC quality
•SSC ECNs
•Interference issues
•Loopback issues
•Dut needs custom
sequence
•DUT drops out easily
•Calibration issues
•Inconsistent
•Poor Sj/Rj mod
•Automation of Cal
•RX and TX Equalizer Tuning
•Jitter tolerance failures
Compliant SJ
Poor/wrong SJ
Compliant SSC Profile
Intentional SSC Stress
Non-deterministic noisy SSC
© Agilent Technologies, 2014
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