Agilent Technologies E5071C Manuel d'utilisateur télécharger pdf (Page 14)

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Accurate, easy-to-use solution

for on wafer test

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Simplify material evaluation

On-wafer measurements

For successful evaluation of on-wafer semiconductor or RF

MEMS devices, the total accuracy of your measurement

system and easy operation are crucial. The ENA offers

state-of-the-art features for accurate measurements

and compatibility with many probe systems.

On-wafer measurements

A complete solution for your on-wafer measurements.

▼ Accurate calibration at probe tips

▼ Supported by IC-CAP and ADS connection manager

▼ Supported by popular on-wafer calibration software

▼ Two GSGSG probe contacts using a 4-port test set

Material measurements

Simplifiy your material test in the RF range by combining

the ENA with ready-to-use Agilent Materials software and

probe kits. The ENA’s highly-accurate measurements will

help you determine the highest performing materials for

your application, shortening your design time.

Dielectric Constant

Measure the dielectric characteristics over a wide

frequency range.

▼ Supported by 85071E Material Measurement software

and the 85070E probe system

Application Note: In-Fixture Characterization Using the ENA Series RF

Network Analyzer with Cascade Microtech Probing System,

http://cp.literature.agilent.com/litweb/pdf/5988-6522EN.pdf

For additional information regarding Cascade Microtech, visit:

www.cascademicrotech.com

For additional information regarding material software, visit:

www.agilent.com/find/materials

Agilent ENA and Cascade Sumimit 12000

85070E Dielectric Probe Kit

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Agilent Technologies E5071C Manuel d'utilisateur Page 14