Agilent Technologies 24A Guide de l'utilisateur Page 387

  • Télécharger
  • Ajouter à mon manuel
  • Imprimer
  • Page
    / 453
  • Table des matières
  • MARQUE LIVRES
  • Noté. / 5. Basé sur avis des utilisateurs
Vue de la page 386
7-42
Operating Concepts
Measurement Calibration
However, all of the incident signal does not always reach the unknown. Refer to Figure
7-26. Some of (I) may appear at the measurement system input due to leakage through the
test set or through a signal separation device. Also, some of (I) may be reflected by
imperfect adapters between a signal separation device and the measurement plane. The
vector sum of the leakage and the miscellaneous reflections is the effective directivity, E
DF
.
Understandably, the measurement is distorted when the directivity signal combines
vectorally with the actual reflected signal from the unknown, S
11A
.
Figure 7-26 Effective Directivity E
DF
Since the measurement system test port is never exactly the characteristic impedance
(50 ohms), some of the reflected signal bounces off the test port, or other impedance
transitions further down the line, and back to the unknown, adding to the original incident
signal (I). This effect causes the magnitude and phase of the incident signal to vary as a
function of S
11A
and frequency. Leveling the source to produce a constant incident signal
(I) reduces this error, but since the source cannot be exactly leveled at the test device
input, leveling cannot eliminate all power variations. This re-reflection effect and the
resultant incident power variation are caused by the source match error, E
SF
as shown in
Figure 7-27.
Figure 7-27 Source Match E
SF
Vue de la page 386
1 2 ... 382 383 384 385 386 387 388 389 390 391 392 ... 452 453

Commentaires sur ces manuels

Pas de commentaire