Agilent Technologies 24A Guide de l'utilisateur Page 61
- Page / 453
- Table des matières
- MARQUE LIVRES
Noté. / 5. Basé sur avis des utilisateurs
1-48
Making Measurements
Measuring Electrical Length and Phase Distortion
When you increase the aperture, the analyzer removes fine grain variations from the
response. It is critical that you specify the group delay aperture when you compare
group delay measurements.
Figure 1-38 Group Delay Example Measurement with Smoothing
5. To increase the effective group delay aperture, by increasing the number of
measurement points over which the analyzer calculates the group delay, press:
As the aperture is increased the “smoothness” of the trace improves markedly, but at
the expense of measurement detail.
Figure 1-39 Group Delay Example Measurement with Smoothing Aperture
Increased
SMOOTHING APERTURE
5
x1
- User’s Guide 1
- Certification 2
- Assistance 2
- Safety Notes 3
- How to Use This Guide 3
- Documentation Map 4
- Contents 10
- 1 Making Measurements 14
- Making a Basic Measurement 17
- Using Display Functions 23
- Blanking the Display 34
- Using Markers 37
- To Activate Display Markers 38
- To Use Delta (∆) Markers 41
- To Activate a Fixed Marker 42
- To Use Polar Format Markers 45
- To Use Smith Chart Markers 46
- Setting the CW Frequency 51
- Measuring Electrical Length 56
- Measuring Phase Distortion 59
- Definitions 63
- Measuring Amplifiers 66
- Measuring Gain Compression 67
- (ES Analyzers Only) 71
- Trans: FWD S21 (B/R) 80
- Connect the Device Under Test 81
- Calibrate and Measure 84
- (Power: 0 dBm/IF BW: 3700 Hz) 85
- Using Linear Sweep 85
- Using Swept List Mode 85
- Creating Flat Limit Lines 87
- Creating a Sloping Limit Line 89
- Creating Single Point Limits 91
- Editing Limit Segments 92
- Running a Limit Test 92
- Offsetting Limit Lines 93
- Editing Ripple Test Limits 98
- Running the Ripple Test 100
- Making Measurements 101
- RIPL LIMIT on OFF 101
- RIPL VALUE BAND 103
- RIPL VALUE [ABSOLUTE ] 103
- RIPL VALUE [MARGIN ] 104
- Setting Up Bandwidth Limits 105
- Running a Bandwidth Test 107
- BW MARKER on OFF 108
- BW DISPLAY on OFF 109
- Using Test Sequencing 111
- Running a Sequence 113
- Stopping a Sequence 113
- Editing a Sequence 113
- Changing the Sequence Title 116
- Storing a Sequence on a Disk 117
- Loading a Sequence from Disk 117
- Purging a Sequence from Disk 117
- Printing a Sequence 118
- Loop Counter Example Sequence 127
- Limit Test Example Sequence 130
- 2 Making Mixer Measurements 132
- Using This Chapter 133
- Measurement Considerations 135
- How RF and IF Are Defined 138
- mode, the 139
- Power Meter Calibration 143
- Scale Ref 149
- AUTOSCALE 149
- Measurement 155
- Fixed IF Mixer Measurements 157
- Sequence 2 Setup 162
- Phase Measurements 165
- Amplitude and Phase Tracking 169
- , press: 172
- LO to RF Isolation 175
- RF Feedthrough 177
- SWR / Return Loss 180
- Velocity Factor 190
- --------= 190
- Time Domain Bandpass Mode 192
- Time Domain Low Pass Mode 195
- (Real Format) 198
- the CW frequency. For 203
- Windowing 207
- Circuit (Real Format) 209
- Resolution 212
- Range Resolution 214
- Setting the Gate 216
- Selecting Gate Shape 216
- Measurement Results 217
- Configuring a Print Function 220
- Defining a Print Function 222
- 1. Press 223
- Configuring a Plot Function 226
- Defining a Plot Function 231
- Selecting Line Types 233
- Choosing Scale 233
- Choosing Plot Speed 234
- To View Plot Files on a PC 238
- Using Ami Pro 239
- Using Freelance 239
- Save/Recall 247
- Parameters 250
- SYSTEM CONTROLLER 251
- Places Where You Can Save 252
- Saving an Instrument State 254
- Saving Measurement Results 255
- ASCII Data Formats 257
- #HZSDBR50 259
- Saving in Textual (CSV) Form 260
- Instrument State Files 262
- GRAPHICS on OFF 264
- DEFINE DISK-SAVE 264
- Re-Saving an Instrument State 266
- Deleting a File 267
- Renaming a File 268
- Recalling a File 269
- Formatting a Disk 269
- Interconnecting Cables 274
- Connector Repeatability 274
- Temperature Drift 275
- Frequency Drift 275
- Performance Verification 275
- , the test 278
- Increasing Sweep Speed 280
- To Widen the System Bandwidth 282
- To Set the Sweep Type 282
- To Activate Chop Sweep Mode 283
- To Use External Calibration 283
- Increasing Dynamic Range 285
- Reducing Noise 286
- Reducing Receiver Crosstalk 288
- Reducing Recall Time 288
- 6 Calibrating for Increased 289
- How to Use This Chapter 290
- Introduction 291
- Calibration Considerations 292
- Saving Calibration Data 293
- Restarting a Calibration 293
- The Calibration Standards 293
- 360° fl××() 295
- Interpolated Error Correction 296
- Types of Error Correction 298
- Receiver Calibration 303
- Measurements 305
- DONE ENH RESP CAL 313
- DONE: 1-PORT CAL 316
- DONE 2-PORT CAL 320
- Matched Adapters 333
- Fixtures 337
- TRL Error Correction 339
- LRM Error Correction 342
- 7 Operating Concepts 346
- System Operation 348
- The Built-In Test Set 349
- The Receiver Block 349
- The Microprocessor 349
- Required Peripheral Equipment 349
- Processing 350
- Processing Details 351
- Operating Concepts 352
- Processing 352
- COUPLED CH OFF 352
- Output Power 354
- Power Coupling Options 355
- Sweep Time 356
- Channel Stimulus Coupling 359
- Sweep Types 360
- Power Sweep (dBm) 364
- CW Time Sweep (Seconds) 364
- Selecting Sweep Modes 364
- S-Parameters 365
- The S-Parameter Menu 367
- Analyzer Display Formats 369
- Group Delay Format 370
- Smith Chart Format 371
- Polar Format 372
- Linear Magnitude Format 373
- SWR Format 374
- Real Format 374
- Imaginary Format 375
- Group Delay Principles 375
- SMOOTHING APERTURE 377
- Electrical Delay 378
- Noise Reduction Techniques 379
- IF Bandwidth Reduction 381
- Measurement Calibration 382
- RESUME CAL SEQUENCE 393
- Calibration Routines 399
- Modifying Calibration Kits 401
- Procedure 402
- Modify Calibration Kit Menu 402
- may still 404
- Verify performance 409
- Why Use TRL Calibration? 411
- TRL Terminology 412
- Calibration 415
- The TRL Calibration Procedure 416
- OFFSET Z0 418
- SET REF: THRU 421
- GPIB Operation 422
- GPIB STATUS Indicators 423
- System Controller Mode 423
- Talker/Listener Mode 423
- Pass Control Mode 423
- Address Menu 424
- Using the Parallel Port 424
- The GPIO Mode 425
- Limit Line Operation 426
- Edit Limits Menu 427
- Edit Segment Menu 427
- Offset Limits Menu 427
- Knowing the Instrument Modes 428
- 8753E 8753ES 431
- Yes Yes Yes 433
- General Information 435
- Safety Symbols 437
- Instrument Markings 437
- Safety Considerations 438
- Servicing 439
- Declaration of Conformity 441
- , conversion 445
- Index-10 451
- Index-11 452
- Index-12 453
Produits connexes et manuels pour Mesure, test et contrôle Agilent Technologies 24A
(13 pages)
(18 pages)© 2020, manymanuals.fr. Tous droits réservés | 0.066 s |
Manymanuals.com
Manymanuals.de
Manymanuals.fr
Manymanuals.it
Manymanuals.pl
Manymanuals.cz
Manymanuals.es
Manymanuals-pt.com
Commentaires sur ces manuels