4
Agilent 85108L pulsed-RF network analyzer system
(45 MHz to 2 GHz)
Based on an 8510C with Option 008, this system
provides the capability to measure the amplitude
and phase response of a device or component
being driven with a pulsed-RF input signal. The
instruments are integrated in a 1600 mm system
rack, the system is fully tested, and a complete sys-
tem verification is performed prior to shipment
from the factory. Installation is included at no
additional charge.
System components include:
8510C network analyzer with Option 008
(pulsed-RF measurement capability)
85110L test set
1600 mm rack
83620B synthesizer with Options
001/004/008/H80
83620B synthesizer with Options 004/008/H80
Calibration kits and test port cables in the
appropriate connector interface are not
included and must be ordered separately.
• Option 010 add time domain capability to 8510C
• Option 230 220/240 V line voltage operation
• Option W31 add two years additional on-site
service
Agilent 85122A high frequency device modeling system
(45 MHz to 20 GHz)
When combined with the 85190 series high fre-
quency IC-CAP software, along with Cascade
probes or ICM fixtures, the 85122A can be used to
model BJT, FET, MOS, and diode devices. All
instruments are integrated in a 1600 mm system
rack prior to shipment from the factory.
Installation is included at no additional charge.
System components include:
8510C network analyzer
8514B test set
83621B synthesizer
11612A Option K10/K20 force/sense bias networks
4142B Option 400/410 DC source/monitor
85131F cable set
1600 mm rack
Probes, fixtures, calibration kits, 85190 series
software, and workstation must be ordered
separately.
• Option 230 provides system cabinet set up for
220/240 V operation
Custom configurations available to meet other fre-
quency coverage and power requirements.
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