Agilent Technologies Agilent 8164A Guide de l'utilisateur télécharger pdf (Page 122)

Performance Tests Power Tests

122 Agilent 81600B Tunable Laser Source Family, Fourth Edition

Calculate spectral SSE by using the following equation:

Spectral SSE

= |power@SSE_peak| - |max_SSE_power| + 3 [dB/nm]

Note the value in the Test Record.

Signal-to-Total-Source Spontaneous

Emission Ratio - Low SSE Ouptput

For definition, see “Signal to total source spontaneous emission ratio” on

page 47.

Measurement Principle

The TLS module is set to a number of wavelengths. For each wavelength,

the Signal-to-Source Spontaneous Emission Ratio (SSE) spectrum is

measured in the specified wavelength range using an OSA resolution

bandwidth of 1 nm. One sample per nm is taken and summed to the total

SSE. The SSE spectrum near the signal (within a ±3 nm window) is

substituted by the average SSE based on the last sample on the left, at -3

nm, and the first sample on the right, at +3 nm.

Extrapolation to an RBW of 1 nm: The measurements were performed

at a resolution bandwidth of 0.5 nm. Adding 3 dB takes the resolution to

1 nm, so giving the SSE in [dB/nm]

(A factor of 2 in the RBW gives 2 x power = 3 dB).

For example:

RBW = 0.5 nm results in |SSE

0.5 nm

| = 44.3 dB measured

RBW = 1 nm extrapolates to |SSE

1nm

| = |SSE

0.5 nm

| - 3 dB

= 44.3 dB - 3 dB = 41.3 dB.

NOTE

Qualified Agilent Service Center recommended: Although the

following description should allow users to verify their products'

performance, due to the high complexity of this test Agilent recommends

that it be performed in a qualified Agilent Service Center.

NOTE

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Agilent Technologies Agilent 8164A Guide de l'utilisateur Page 122