Agilent Technologies Agilent 8164A Guide de l'utilisateur télécharger pdf (Page 144)

Performance Tests Optional Performance Tests

144 Agilent 81600B Tunable Laser Source Family, Fourth Edition

Dynamic Wavelength Repeatability

This section describes the analysis steps leading to wavelength

repeatability with reference to a single sweep speed.

Repeat them until all sweep speeds of interest are covered.

The only measurement results to be considered here are the results of the

threshold-crossing analysis in the continuous sweep measurements:

LOGGED

(i, n) i = 1, 2, ... 60 x 2, n = 1, ... 5 (scan repetition)

The results from all the tested wavelength intervals should here be merged

in a single array, since the final results must hold for the specification of

the whole TLS wavelength range.

Analysis

1 Estimate the local repeatability for each control wavelength as the

sample variances

(i) among the repeated scans:

(i) = 1/(5-1)*{Σ

j=1...5

[λ

LOGGED

(i,j)]

-5*{Σ

j=1...5

[λ

LOGGED

(i,j)/5]

} }

i = 1,2, ...60* 2

and its average over all control points

= 1/120 * Σ

i=1...120

[σ

(i)]

2 Calculate the Dynamic Wavelength Repeatability (see Definition of

Te r ms ) , gi v e n a s ±REP, using:

REP = +/- 2.663 * sqrt(

)

peak-to-peak deviation: REP

peak-to-peak

= 2 * 2.663 * sqrt(σ

)

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Agilent Technologies Agilent 8164A Guide de l'utilisateur Page 144