Agilent Technologies Option H48 Multiport Test Set Z5623A Spécifications Page 89
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- Table des matières
- MARQUE LIVRES
Noté. / 5. Basé sur avis des utilisateurs
19
Page 37
安捷倫科技高頻元件量測研討會
Feb.23, 2006
How close can two reflection sites be and still be
seen as independent events?
The TDR edge needs time
to reach its full height
before the next event is
encountered
So what determines the
two-event resolution?
Answer: It’s not just the
TDR step speed!
Page 38
安捷倫科技高頻元件量測研討會
Feb.23, 2006
A 35 picosecond step is insufficient to see closely spaced
reflections
With a 35 ps step, all you know is the device is there
If there is more than one reflection, we can’t tell
35ps
- 安捷倫科技高頻元件量測研討會 1
- Packaging Development 2
- Trend of Integrated 2
- Analysis 2
- Interesting Semiconductor 3
- Why SIP ? 4
- Die Stacking Package Trend 4
- PoP and PiP 5
- Fine Pitch Wire Bonding 5
- Analysis Case I : 7
- Analysis Case II : 9
- Analysis Case IV : 10
- Analysis Case V : 11
- Website: www.aseglobal.com 14
- Thank You For Your Listening 15
- PNA Based Solutions 16
- • Saves battery power 18
- Pulsed Antenna Test 19
- Radar and Electronic-Warfare 20
- VNA Pulsed-RF Measurements 21
- VNA data display 22
- Note: PNA controls timing 23
- Using Wideband Detection 24
- Time domain 25
- Frequency domain 25
- Typical Hardware Setup 26
- (Narrowband) 26
- COTS stand alone hardware 27
- Comparing the 8510 and PNA 28
- CTS-I Family 29
- CTS-II Family 29
- Z5623A Hxx RF Modulators 30
- • Average pulse measurements 31
- Advantage: pulsed bias to 34
- 10 MHz Ref 35
- Resources 36
- Target Applications 37
- Diversity Rx 38
- WLAN FEM（2.4G・５G dual band） 39
- UMTS1900 40
- (Available December 2005) 41
- PNA/PNA-L Option 550 42
- Variety Summary 42
- Test Sets Overview 43
- Platform 43
- Description Benefits 43
- Multiport Specials – Variety 44
- •Extension Test Sets 44
- • Hybrid Test Sets 45
- • Switching Test Sets 45
- Multiport Special 48
- Multiport Qualification 49
- Information Sources 50
- Ming-Fan, Tsai 51
- Overview 52
- Interconnects 54
- Legacy Backplane System 56
- TDR and VNA Techniques 57
- Microprobing on SMA Pads 58
- Port 2Port 1Port 2Port 1 61
- Conclusions 63
- • length is different 66
- TDR or VNA 68
- FREE Agilent Email Updates 70
- Z Impedance? 71
- Short Termination 72
- Open Termination 72
- Perfect Termination 73
- Impedance Mismatch Terms 73
- Mismatch Exercise 74
- T = transit time 75
- Series R-C 77
- Shunt R-C 77
- Introducing 86100C option 202 79
- - TDR S-Parameters capability 79
- What is Normalization? 82
- University (Bracewell 82
- Transform) 82
- Critical for Rambus! 82
- Fixture DUT 83
- Comparison of TDR and PNA 84
- TDR vs VNA comparison 85
- N1024A TDR Calibration Kit 86
- Diff. TDR Probe 87
- TDR Accessories 87
- At 9 ps step speed, we see 5 90
- Each event is easily seen 90
- Optimizing 91
- Configuring a system 91
- •Extensive Calibration 92
- •Eye diagram simulation 92
- •N5320A-225 20G VNA 92
- •N5320A-240 20G VNA 92
- •54754Ax2 TDR base 92
- Clock Frequency (MHz) 95
- Simulation Leadership 97
- From Touchstone to ADS 98
- ADS for Signal Integrity 98
- Typical SI Problem 100
- Simulators 101
- Measurements 101
- Agilent Ptolemy 102
- Link Level Simulation 103
- Transmitter with Pre-Emphasis 104
- Channel Model 104
- Channel Subnetwork 105
- Interconnect Models 106
- EM Models - Momentum 106
- Momentum RF 107
- Quasi-Static Electromagnetics 107
- Comparison of Models 107
- Pre-emphasis 108
- Encoding/Decoding 108
- Source descriptions 108
- Integration of other Models 109
- Measurement-based Models 110
- Probing Solution + PLTS + ADS 110
- Bringing it All Together 111
- Signal Integrity Resources 111
- –Length – 2 days – hands-on 113
- Using ADS for Signal 114
- Integrity Design 114
- Wireline Applications 115
- IBIS Library 117
- Signal Integrity Applications 118
- TDR Simulation Instrument 118
- FrontPanels: Eye Diagram 121
- Oscilloscope Mode 122
- Eye/Mask Mode 123
- Receiver 125
- Example Test Board 126
- Create Models from Data 127
- DCA/BERT Measurement Setup 127
- Simulation 128
- DCA Measurement of BERT 129
- Simulation with Measured Data 129
- IBIS Model 130
- Importing IBIS Component 132
- Installation of design kit 133
- IBIS design kit components 133
- Pin Number 134
- V_fixture 134
- Momentum 135
- Digital Board Interconnect 137
- Advanced Calibration 139
- Techniques and Fixturing 139
- Issues for VNAs 139
- Agilent Technologies Ltd 139
- Course Goal 140
- Objectives 140
- “Hawaii” 140
- What’s Totally New in 6.0… 141
- What’s New in 6.0 From 5.0… 141
- Old Calibration Paradigm 143
- New Calibration Paradigm 144
- Old Calset File Location 145
- New Cal File Locations 145
- Limited Instrument State 146
- Extended Instrument State 146
- Pointer to Calset 146
- Error Terms 146
- Receiver calibration 147
- What is a “Delta Match” cal? 148
- Test port 2 149
- Test port 1 149
- Delta Match Cal 151
- When is Delta Match Used? 151
- Global Delta Match 152
- User Delta Match 152
- Using 2-Port ECal Modules 153
- Cascade’s WinCal 2006 157
- Frequently Asked Questions 158
- TRL Summary 158
- • Auto port extensions 159
- • Embedding/de-embedding 159
- • Measuring fixtures/probes 159
- Non-Insertable ECal Modules 160
- Unknown Thru to the Rescue! 161
- Unknown Thru Algorithm 161
- 1-port calibrations 162
- Unknown thru 162
- Cable Movement Error 163
- (Usual Way) 164
- (Unknown Thru) 165
- CABLE MOVEMENT 166
- Different connector 167
- Finish multiport cal 167
- 1.85 f-f adapter comparison 168
- 3. Higher-order modes 169
- Fixture And Probe Techniques 170
- Probe Probe 171
- Offset Load Definition 172
- Offset Load Class Assignments 172
- Thru Loss Definition 173
- Error Correction Choices 174
- Coaxial calibration 175
- Measurement Results 176
- Which Standards Should I Use? 178
- Broadband APE Example 178
- Narrowband APE Example 179
- Adjusting for Mismatch 179
- Active Span or Active Marker 180
- Loss at DC 180
- Fixturing for the Masses 182
- Order of Fixturing Operations 182
- Port Matching 183
- Differential Port Matching 183
- Port Z (Impedance) Conversion 184
- 2-Port De-Embedding 185
- 4-Port Embedding/De-Embedding 185
- Answer: Crosstalk terms! 186
- On-wafer SMC Measurements 187
- Unknown thru and DUT 189
- 2-port calibration 190
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