Agilent Technologies Option H48 Multiport Test Set Z5623A manuels

Manuels d'utilisation et guides de l'utilisateur pour Mise en réseau Agilent Technologies Option H48 Multiport Test Set Z5623A.
Nous fournissons des manuels en pdf 4 Agilent Technologies Option H48 Multiport Test Set Z5623A à télécharger gratuitement par type de document : Manuel d'utilisateur, Manuel de service, Spécifications


Table des matières

Agilent Technologies

1

Z5623A Option H48

1

Warranty Statement

2

Safety Notes

3

Statement of Compliance

3

Definitions

3

Contents

5

5. Performance Verification

6

10. Contacting Agilent

8

Instrument Description

9

Overview

10

Guaranteed Performance

12

Typical Performance

13

Electrical Requirements

14

Environmental Requirements

14

General Characteristics

15

Available Options

15

Cleaning

16

Shipping

16

Installation

17

Checking the Shipment

18

Electrical Preparations

20

Figure 2-2 Power Cables

22

Environmental Preparations

23

Test Set Familiarization

25

Rear Panel

27

The Line Fuse

28

ADDRESS:

29

Control the Test Set

33

Click on

35

C:\Progam Files\National

38

How to Send a Manual Command

39

A List of GPIB Commands

41

Configuration

44

Disaster Recovery

45

Four applications running

46

No applications running

46

Calibrating the Network

51

Analyzer

51

Performing the Calibration

52

Renaming the Calibration File

57

Files” icon

58

How to Recall a Calibration

64

Setting Test Limits

70

Test Strategy

72

Insertion Loss

73

Return Loss

73

Crosstalk

74

Saving the Limit Test File

83

Limit Testing for Crosstalk

94

Power window

95

Performance Verification

100

Setting Up Limit Testing

100

Specifications

104

Verifying Crosstalk Specs

107

Measuring Multiport Devices

109

Calibrating the Test System

110

Calibration and Test

111

Advanced Topics

113

Test Set

114

Languages

115

Suggested External Circuitry

119

8 Service

123

Adjustments

124

Theory of Operation

125

A4 Front Panel Display Theory

126

Connector Replacement

126

Troubleshooting

127

List of Replaceable Parts

129

Safety Information

132

Cautions

133

Instrument Markings

134

Regulatory Information

135

Contacting Agilent

137

Table des matières

安捷倫科技高頻元件量測研討會

1

Packaging Development

2

Trend of Integrated

2

Analysis

2

Interesting Semiconductor

3

Why SIP ?

4

Die Stacking Package Trend

4

PoP and PiP

5

Fine Pitch Wire Bonding

5

Analysis Case I :

7

Analysis Case II :

9

Analysis Case IV :

10

Analysis Case V :

11

Website: www.aseglobal.com

14

Thank You For Your Listening

15

PNA Based Solutions

16

• Saves battery power

18

Pulsed Antenna Test

19

Radar and Electronic-Warfare

20

VNA Pulsed-RF Measurements

21

VNA data display

22

Note: PNA controls timing

23

Using Wideband Detection

24

Time domain

25

Frequency domain

25

Typical Hardware Setup

26

(Narrowband)

26

COTS stand alone hardware

27

Comparing the 8510 and PNA

28

CTS-I Family

29

CTS-II Family

29

Z5623A Hxx RF Modulators

30

• Average pulse measurements

31

Advantage: pulsed bias to

34

10 MHz Ref

35

Resources

36

Target Applications

37

Diversity Rx

38

WLAN FEM(2.4G・5G dual band)

39

UMTS1900

40

(Available December 2005)

41

PNA/PNA-L Option 550

42

Variety Summary

42

Test Sets Overview

43

Platform

43

Description Benefits

43

Multiport Specials – Variety

44

•Extension Test Sets

44

• Hybrid Test Sets

45

• Switching Test Sets

45

Multiport Special

48

Multiport Qualification

49

Information Sources

50

Ming-Fan, Tsai

51

Overview

52

Interconnects

54

Legacy Backplane System

56

TDR and VNA Techniques

57

Microprobing on SMA Pads

58

Port 2Port 1Port 2Port 1

61

Conclusions

63

• length is different

66

TDR or VNA

68

FREE Agilent Email Updates

70

Z Impedance?

71

Short Termination

72

Open Termination

72

Perfect Termination

73

Impedance Mismatch Terms

73

Mismatch Exercise

74

T = transit time

75

Series R-C

77

Shunt R-C

77

Introducing 86100C option 202

79

- TDR S-Parameters capability

79

What is Normalization?

82

University (Bracewell

82

Transform)

82

Critical for Rambus!

82

Fixture DUT

83

Comparison of TDR and PNA

84

TDR vs VNA comparison

85

N1024A TDR Calibration Kit

86

Diff. TDR Probe

87

TDR Accessories

87

At 9 ps step speed, we see 5

90

Each event is easily seen

90

Optimizing

91

Configuring a system

91

•Extensive Calibration

92

•Eye diagram simulation

92

•N5320A-225 20G VNA

92

•N5320A-240 20G VNA

92

•54754Ax2 TDR base

92

Clock Frequency (MHz)

95

Simulation Leadership

97

From Touchstone to ADS

98

ADS for Signal Integrity

98

Typical SI Problem

100

Simulators

101

Measurements

101

Agilent Ptolemy

102

Link Level Simulation

103

Transmitter with Pre-Emphasis

104

Channel Model

104

Channel Subnetwork

105

Interconnect Models

106

EM Models - Momentum

106

Momentum RF

107

Quasi-Static Electromagnetics

107

Comparison of Models

107

 Pre-emphasis

108

 Encoding/Decoding

108

 Source descriptions

108

Integration of other Models

109

Measurement-based Models

110

Probing Solution + PLTS + ADS

110

Bringing it All Together

111

Signal Integrity Resources

111

–Length – 2 days – hands-on

113

Using ADS for Signal

114

Integrity Design

114

Wireline Applications

115

IBIS Library

117

Signal Integrity Applications

118

TDR Simulation Instrument

118

FrontPanels: Eye Diagram

121

Oscilloscope Mode

122

Eye/Mask Mode

123

Receiver

125

Example Test Board

126

Create Models from Data

127

DCA/BERT Measurement Setup

127

Simulation

128

DCA Measurement of BERT

129

Simulation with Measured Data

129

IBIS Model

130

Importing IBIS Component

132

Installation of design kit

133

IBIS design kit components

133

Pin Number

134

V_fixture

134

Momentum

135

Digital Board Interconnect

137

Advanced Calibration

139

Techniques and Fixturing

139

Issues for VNAs

139

Agilent Technologies Ltd

139

Course Goal

140

Objectives

140

“Hawaii”

140

What’s Totally New in 6.0…

141

What’s New in 6.0 From 5.0…

141

Old Calibration Paradigm

143

New Calibration Paradigm

144

Old Calset File Location

145

New Cal File Locations

145

Limited Instrument State

146

Extended Instrument State

146

Pointer to Calset

146

Error Terms

146

Receiver calibration

147

What is a “Delta Match” cal?

148

Test port 2

149

Test port 1

149

Delta Match Cal

151

When is Delta Match Used?

151

Global Delta Match

152

User Delta Match

152

Using 2-Port ECal Modules

153

Cascade’s WinCal 2006

157

Frequently Asked Questions

158

TRL Summary

158

• Auto port extensions

159

• Embedding/de-embedding

159

• Measuring fixtures/probes

159

Non-Insertable ECal Modules

160

Unknown Thru to the Rescue!

161

Unknown Thru Algorithm

161

1-port calibrations

162

Unknown thru

162

Cable Movement Error

163

(Usual Way)

164

(Unknown Thru)

165

CABLE MOVEMENT

166

Different connector

167

Finish multiport cal

167

1.85 f-f adapter comparison

168

3. Higher-order modes

169

Fixture And Probe Techniques

170

Probe Probe

171

Offset Load Definition

172

Offset Load Class Assignments

172

Thru Loss Definition

173

Error Correction Choices

174

Coaxial calibration

175

Measurement Results

176

Which Standards Should I Use?

178

Broadband APE Example

178

Narrowband APE Example

179

Adjusting for Mismatch

179

Active Span or Active Marker

180

Loss at DC

180

Fixturing for the Masses

182

Order of Fixturing Operations

182

Port Matching

183

Differential Port Matching

183

Port Z (Impedance) Conversion

184

2-Port De-Embedding

185

4-Port Embedding/De-Embedding

185

Answer: Crosstalk terms!

186

On-wafer SMC Measurements

187

Unknown thru and DUT

189

2-port calibration

190





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