Agilent Technologies 54657A Guide de l'utilisateur

User’s GuidePublication Number 54657-97019August 2000For Safety information, Warranties, and Regulatoryinformation, see the pages behind the index© C

Installation This chapter provides you with the information necessary to installthe Measurement/Storage Module on the oscilloscope. Informationrequir

To install the Measurement/Storage Module1 Turn off the oscilloscope. 2 Install the module as shown below. The oscilloscope is reset after installatio

To configure the interface The Measurement/Storage Module can be connected to a printer, a plotter, ora computer through the interface. The 54657A ha

54658A Serial ConnectionsThe signals for the RS-232 port on the 54658A are listed below.Pin Number Signal2 Transmit Data3 Receive Data4 Request to Sen

Pin out of 13242G/17255M RS-232 cablePin out of 24542G RS-232 cable Pin out of 92219J/ 17255D RS-232 cable54645b09.cdr13242G/17255MCablePrinter/plotte

54659B Serial ConnectionsThe signals for the 9-pin RS-232 port on the 54659B are listed below. Pin Number Signal1 Data Carrier Detect2 Receive Data3 T

1–8

2Operating theMeasurement/Storage Module

Operating the Measurement/StorageModuleThis chapter provides you with the information necessary to use theadditional, or enhanced features that the Me

Math FunctionsWithout the Measurement/Storage module installed, addition and subtractionare the only math operations provided. In addition to the lim

Measurement/Storage ModulesThe Agilent 54657A, 54658A, and 54659B Measurement/StorageModules provide additional measurement and storage capabilities t

Function 11 Press ± . 2 Toggle the Function 1 On Off softkey to enable math function number 1.3 Press the Function 1 Menu softkeyA softkey menu with

Function 2Function 2 will plot differential or integral waveforms, or perform an FFTusing the input signals connected to the vertical inputs (1 and 2)

The integrate calculation is relative to the currently selected source’sinput offset. The following examples illustrate any changes in offsetlevel.In

7 Press the Offset (differentiate and integrate) or Ref Levl (FFT) softkeyand rotate the knob closest to the Cursors key to set the offset(from the c

FFT Measurement Operating System Requirements Refer to "Oscilloscope Compatibility" on page 1-2 for operating systemrequirements for FFT ope

Aliasing When using FFT’s, it is important to be aware of aliasing. Thisrequires that the operator have some knowledge as to what thefrequency domai

Spectral Leakage The FFT operation assumes that the time recordrepeats. Unless there is an integral number of cycles of the sampledwaveform in the re

•Cent Freq Allows centering of the FFT spectrum to the desired frequency.Select and rotate the knob closest to the Cursors key to set thecenter freq

The following FFT spectrum was obtained by connecting the front panelprobe adjustment signal to input 1. Set Time/Div to 500 s/div, Volts/Div to100 m

FFT Measurement Hints – ContinuedWhile the FFT spectrum is displayed, use the and Cursor keys to switch betweenmeasurement functions and frequency do

Accessories available34810B BenchLink/Scope software package.10833A 1 meter (3.3 feet) GPIB cable.10833B 2 meter (6.6 feet) GPIB cable.10833C 4 meter

Automatic Measurements With the Measurement/Storage Module installed, the oscilloscope is capableof making five additional automatic voltage and time

Setting Thresholds Without the Measurement/Storage module installed, rise time and fall timemeasurements are performed at the 10%/90% threshold levels

User Thresholds 1 Press Time . 2 Press the Next Menu softkey until the Define Thresholds softkey isdisplayed on the far left side. 3 Press the Defin

•Voltage Rise time/fall time measurements performed at the lower andupper levels specified by you. Frequency, period, duty cycle, positivepulse widt

User Threshold Rise Time MeasurementFigure 2– 6Operating the Measurement/Storage ModuleSetting Thresholds 2–18

To make delay measurements automatically You can measure the delay of signals connected to the oscilloscope’s input 1and input 2 connectors when the M

7 Press the Measure Delay softkey. Delay is measured and displayed onthe screen. Negative delay values indicate the defined edge on channel 1 occurr

To make phase measurements automatically Phase shift between two signals can be measured using the Lissajous method.Refer to the User and Service Guid

Automatic Phase MeasurementFigure 2– 8Operating the Measurement/Storage ModuleTo make phase measurements automatically 2–22

To make additional voltage measurementsautomatically With the Measurement/Storage Module is installed, the following additionalautomatic voltage measu

In This BookThis book is the user’s guide for the Agilent 54657A, 54658A, and 54659BMeasurement/Storage Modules, and contains three chapters.Installat

1 Adjust controls until the desired signal is displayed. 2 Press Voltage . 3 Press the Source softkey until the desired source is selected. 4 Press

To make additional cursor measurements Without the Measurement/Storage Module installed, cursor measurementscan be performed on channels 1 through 4,

•V2 reads the percentage the V2 marker has moved from the established100% position. Negative readings indicate marker has moved through theestablishe

11Press the Set 100% softkey to set the t1 marker to 0° and the t2 markerto 360°. All readings (except second ∆t display in seconds) are nowrelative

Cursor Measurement Hints If cursors are positioned too closely together, an error will be displayed whenthe SET softkey is selected. Displayed marker

Unattended Waveform Monitoring The Measurement/Storage Module simplifies circuit debugging by comparingan active channel (not functions) trace on the

To create a mask template using Automask A mask template contains two limit lines: minimum and maximum.Automask allows you to easily generate a mask

To create a mask template using Autostore An envelope of the passing region can be generated using the Autostorefunction. Then the Automask function

11 Press the Tolerance softkey, then turn the knob closest to the Cursors key to set the tolerance to ±0.0%. If additional tolerance is desired, set

To create or edit a mask using line segments The Measurement/Storage Module has a built-in Mask Editor for creating orediting masks. It provides two

Installation1Reference Information3Operating the Measurement/Storage Module2Indexv

5 Toggle the Edit Line softkey to select the limit line you want to edit.6 Turn the Delay knob to move the X-coordinate of the cursor to thetime corr

To edit an individual pixel of a mask Previously created masks can be edited pixel-by-pixel using the line drawingediting tool. The Delay knob select

To edit the mask to test only a portion of a waveform In certain circumstances, not all the points on the waveform need to betested. Only the area of

Mask Editing Operating HintEach limit line can have its own selectable test region. The figure below shows a mask that tests the overshoot of the wave

To start waveform monitoring Before using a testing mask to monitor a waveform, the mask must becreated. Once created, the mask is automatically stor

•Increment This softkey is displayed only when Save To Trace is selected.When On, all test violations are saved by incrementing the tracenumber. The

To automatically save test violations The signals that fail the waveform monitoring test can be saved, thenviewed/measured at a later time. Provision

Saving Test Violation Data Operating Hint When Increment On is selected, traces ≥3 to 100 are stored in the compressedstate. During the compression a

Creating a delay testing maskA mask can be used to test the channel to channel delay of two input signals.The shape of the mask varies depending on th

The following procedure can be used to setup a mask template for testingchannel to channel delay. In the oscilloscope setup, the controls should be se

vi

Creating a frequency testing mask A mask can be used to test the frequency of the input signal. The shape ofthe mask varies depending on the shape of

The following procedure can be used to setup a mask template for testing thefrequency of a sine wave or a square wave. Similar methods can be used to

Creating an overshoot testing mask There are two parameters associated with the overshoot of a signal: thepercentage of overshoot and the settling ti

The critical factors for creating the mask template are:•The vertical window of the middle region of the mask template determinesthe upper limit of th

Creating a rise time testing mask Mask template testing can be used to test the rise time of a signal, includingspecifying an upper limit for rise tim

1 Determine the top and base of the signal. Use the automatic measurement Vtop and Vbase of the oscilloscope todetermine these values. 2Calculate the

Testing the eye opening of an eye-pattern signal There are generally two tests that you want to perform on an eye-patternsignal: an eye boundary test

1 Set up the oscilloscope for proper viewing of the eye-pattern signal. 2 Determine the fail region.3 Create the mask using the line drawing capabilit

To save or recall traces With the Measurement/Storage Module installed, the two volatile pixelmemories are replaced with four high-speed non-volatile

•Recall Setup Recalls the previously stored front-panel setup that wassaved with the waveform for the trace selected. •Edit Label Used to enter a 20

Contents1 InstallationOscilloscope Compatibility 1–2To install the Measurement/Storage Module 1–3To configure the interface 1–42 Operating the Mea

To create a label for a trace memory Each trace stored in Measurement/Storage Module can have a label up to 20characters long to identify the stored w

To set real-time clock Time (24-hour format) and date tagging of hard copy and nonvolatile tracememories is provided using a built in, battery backed

4 Press the Set Date softkey. A softkey menu with six choices appears. Five of them are related to settingthe real-time clock date. •Day Selects th

3Reference Information

Reference Information This chapter contains reference information for theMeasurement/Storage Modules including its operating characteristics.3–2

Operating Characteristics Operating Characteristics are specified with the Measurement/StorageModule installed on an Agilent 54600–Series Oscilloscope

SelectableWindowsFour windows are selectable: Hanning, for best frequency resolution andgeneral purpose use; flattop, for best amplitude accuracy; re

SweepSpeedEffectiveSampleRateMaximumFrequencySpanSweepSpeedEffectiveSampleRateMaximumFrequencySpan5 s/div2 s/div1 s/div500 ms/div200 ms/div100 ms/div5

Mask Template TestingNumber of masktemplates2, nonvolatileMask templategenerationAutomask generates a mask from waveform data with variabletolerances.

RS-232 ConfigurationsConnector Type With the adapter cable connected, at the end of the cable is a9 pin/25 pin DTE port; a printer cable is required t

3 Reference InformationOperating Characteristics 3–3IndexContentsContents–2

3–8

Index!∫dt, 2–5Aaliasing, 2–9Automask, 2–30automatic measurements, 2–14delay, 2–19phase, 2–21Vamplitude, 2–23voltage, 2–23Vovershoot, 2–23Vpreshoot, 2–

NNyquist frequency, 2–9Ooperating characteristics, 3–3FFT, 3–3hardcopy output, 3–6mask template testing, 3–6measurments, 3–3programmability, 3–7real-t

DECLARATION OF CONFORMITYaccording to ISO/IEC Guide 22 and EN 45014Manufacturer’s Name:Agilent TechnologiesManufacturer’s Address:1900 Garden of the G

Product RegulationsSafety IEC 1010-1:1990+A1 / EN 61010-1:1993UL 3111CSA-C22.2 No.1010.1:1993EMC This Product meets the requirement of the European Co

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VoltageTimeCursorsPress this key . . .. . . to obtain this menu

PrintUtilityTraceTracePress this key . . .. . . to obtain this menu

1Installation