Agilent Technologies 54657A Guide de l'utilisateur télécharger pdf (Page 82)

N

Nyquist frequency, 2–9

O

operating characteristics, 3–3

FFT, 3–3

hardcopy output, 3–6

mask template testing, 3–6

measurments, 3–3

programmability, 3–7

real-time clock, 3–6

RS-232 configurations, 3–7

trace memory, 3–6

operating system, 1–2

oscilloscope compatibility, 1–2

overshoot testing mask, 2–46

P

parallel cable, 1–4

phase measurements, 2–21

phase shift, 2–21

pixel editing, 2–35

plus (+), 2–4

programmability, operating characteristics,

3–7

R

real time clock, operating characteristics,

3–6

real-time clock, set, 2–55

recall traces, 2–52

rectangular window, 2–11

rise time testing mask, 2–48

RS-232

cable, 1–4, 1–6 to 1–7

configurations, characteristics, 3–7

port, 1–5, 1–7

S

save traces, 2–52

saving test violations, 2–40

set real-time clock, 2–55

setting thresholds, 2–15

spectral leakage, 2–10

subtract, 2–4

T

test violations, saving, 2–40

testing mask, creating

delay, 2–42

eye-pattern, 2–50

frequency, 2–44

overshoot, 2–46

rise time, 2–48

thresholds, 2–15

time cursor measurements, 2–26

trace memory label, 2–54

trace memory, operating characteristics,

3–6

traces

non-volatile memories, 2–52

recall, 2–52

save, 2–52

U

unattended waveform monitoring, 2–29

upgrade kit, 1–2

V

Vamplitude, 2–23

voltage cursor measurements, 2–25

voltage measurements, 2–23

Vovershoot, 2–23

Vpreshoot, 2–23

W

waveform mask edit, 2–36

waveform monitoring, 2–29

starting, 2–38

test violations, 2–40

window

exponential, 2–11

FFT, 2–11

flattop, 2–11

hanning, 2–11

rectangular, 2–11

Index

Index–2

1 2 ... 77 78 79 80 81 82 83 84 85 86 87 88 89

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