Agilent Technologies 54502A Manuel de service Page 60

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2. Adjust pulse generator for the output in figure 3-30.
Setting for HP 8161A:
Parameter Output A Output B
Input Mode Norm ---
Period (PER) 20 ns ---
Width (WID) 5 ns ---
Leading Edge (LEE) 1 ns ---
Trailing Edge (TRE) 1 ns ---
High Level (HIL) 3.2 V ---
Low Level (LOL) 0 V ---
Delay (DEL) 0 ns ---
Output Mode ENABLE ---
3. Assign the pod under test to Analyzer 1 in System Configuration as in figure
3-31. Refer to steps a and b if unfamiliar with menus.
a. Move cursor to Type field of Analyzer 1 and SELECT.
b. Set the analyzer Type to Timing using cursor and SELECT.
c. Move cursor to pod to be tested and assign to Machine 1.
4. In State Format Specification assign the lower eight bits of the pod under test
to a label as shown in figure 3-32. Make sure the appropriate eight bits in the
bit assignment field are turned on.
Figure 3-30. Waveform for Glitch Test
Figure 3-31. System Configuration for Glitch Test
HP 1650B/1651B Performance Tests
Service Manual 3-25
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