Agilent Technologies E5503A Guide de l'utilisateur Page 357
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- Table des matières
- MARQUE LIVRES
Noté. / 5. Basé sur avis des utilisateurs
Agilent Technologies E5500 Phase Noise Measurement System
14-7
Baseband Noise Measurement Examples
Baseband Noise without using a Test Set Measurement Example
4. Choose the OK button. The appropriate measurement definition
parameters for this example have been pre-stored in this file. (Table on
page 14-4) lists the parameter data that has been entered for this
measurement example.) a Test Set Measurement
Beginning the
Measurement
1. From the Measurement menu, choose New Measurement.
2. When the Perform a New Calibration and Measurement dialog box
appears, click OK.
Making the
Measurement
3. When the Connect Diagram appears on the computer’s display, click on
the Continue button.
Figure 14-3 Connect Diagram for the Baseband using a Test Set Measurement
- Agilent Technologies E5500A/B 1
- Trademarks 2
- Software License 3
- Third Party Software 4
- Termination 4
- Export Requirements 4
- Limited Warranty 6
- Service and Support 7
- Measurement System 17
- Introduction 18
- Training Guidelines 19
- Solutions 20
- beyond the 21
- System Series of Solutions 22
- 3 Your First Measurement 24
- Designed to Meet Your Needs 25
- Your First Measurement 26
- Making a Measurement 28
- Connect Diagram 31
- 4 Phase Noise Basics 34
- What is Phase Noise? 35
- • long-term stability 35
- • short-term stability 35
- Phase Noise Basics 36
- ConfiguringaSource 43
- Specify the Source 47
- Measurement Noise Floor 53
- Viewing Markers 95
- Omitting Spurs 96
- Exporting Measurement Results 100
- The Phase Lock Loop Technique 104
- Understanding the 105
- Phase-Lock Loop 105
- Technique 105
- The Phase Lock Loop 105
- Tuning Requirements 106
- • Tune Range of VCO, (±V) 107
- The System Noise 108
- The Noise Level of the 109
- Reference Source 109
- Selecting a Reference 110
- • Tuning Voltage Range (V) 111
- Tracking Frequency Drift 114
- Changing the PTR 116
- Signal Generators 117
- Minimizing Injection Locking 118
- Inserting a Device 120
- For Example 121
- Determining the Phase 122
- Lock Loop Bandwidth 122
- Measurement Options 125
- Absolute Measurement Examples 126
- Stable RF Oscillator 127
- Free-Running RF Oscillator 149
- RF Synthesizer using DCFM 173
- RF Synthesizer using EFC 197
- Microwave Source 222
- (V)X(Hz/V) 236
- HzRangeCapture 236
- ❍ Measured Beatnote,page8-16 241
- ❍ Double-Sided Spur,page8-21 241
- ❍ Single-Sided Spur,page8-24 241
- What is Residual Noise? 242
- Frequency Translation 244
- Calibration and 246
- Measurement 246
- Guidelines 246
- Calibrating the Measurement 247
- User Entry of Phase 249
- Detector Constant 249
- The Calibration Options 250
- Measured +/- DC Peak 253
- Advantages: 261
- Disadvantages: 261
- Measurement Difficulties 268
- Residual Measurement Examples 269
- Amplifier Measurement Example 270
- FM Discriminator Fundamentals 284
- The Discriminator 286
- Transfer Response 286
- Compression 288
- Double-Sided Spur Calibration 292
- Determining the 293
- Discriminator 293
- (Delay Line) Length 293
- Defining the 294
- amplitude for a known 297
- Connecting Cables 298
- Measurement Environment 298
- Beginning the 299
- Connect Diagram Example 301
- Making the 302
- When the 304
- Measurement is 304
- Complete 304
- • Amplitude 305
- • Measurement Methods 322
- Basic Noise 323
- Phase Noise 323
- Amplitude Noise Measurement 324
- AM Detector Considerations 326
- Procedure 329
- Disadvantages 333
- Method 2: Double-Sided Spur 334
- Method 3: Single-Sided-Spur 339
- AM Noise Measurement Examples 340
- Option 001 341
- L(f) graph) 361
- Looking For Obvious 361
- Problems 361
- Evaluating the Results 362
- Gathering More Data 365
- Outputting the Results 366
- Graph of Results 367
- • Marker,page15-9 367
- • Omit Spurs,page15-10 367
- Problem Solving 372
- 16 Advanced Software Features 378
- Phase Lock Loop Suppression 380
- Ignore Out Of Lock Mode 383
- Advanced Software Features 384
- PLL Suppression 385
- Information 385
- Supporting an 389
- Embedded VXI PC: 389
- Security Level 390
- 17 Error Messages and System 394
- Reference Graphs and Tables 395
- Port Signal Level 396
- L(f) graph to compute S 397
- Approaches UUT Noise 399
- AM Calibration 401
- See Caution 407
- Agilent/HP 8643A 408
- Mode Keys 408
- How to Access Special 409
- Functions 409
- Description of Special 409
- Functions 120 and 125 409
- Agilent/HP 8644B 410
- Function 120 411
- Agilent/HP 8664A 412
- Functions 120 413
- Agilent/HP 8665A 414
- Functions 120 and 124 415
- Agilent/HP 8665B 416
- 19 Connect Diagrams 418
- Connect Diagrams 419
- 20 System Specifications 444
- Specifications 445
- Phase Noise Customer Support 446
- Contacting Customer Support 448
- A Connector Care and 450
- • Dirty or damaged connectors 451
- RF Cable and 452
- Connector Care 452
- Proper Connector 452
- Connector Wear and 453
- SMA Connector 453
- Precautions 453
- Lint-Free cloths: 9310-4242 454
- Small foam swabs: 9300-1270 454
- Large foam swabs 9300-0468 454
- Product Part Number 454
- General Procedures 455
- Precision 2.4 mm and 457
- 3.5 mm Connectors 457
- Other Multipin 458
- Connectors 458
- MMS Module 460
- Removal and 460
- Reinstallation 460
- Touch-Up Paint 461
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