Agilent Technologies EasyEXPERT Guide de l'utilisateur télécharger pdf (Page 80)

8-4 Agilent EasyEXPERT User’s Guide Vol. 2, Edition 1

Application Library

Application Test Definitions

• Interconnection

•MISCAP

•PMIC

•PowerBJT

• PowerDiode

• PowerMOSFET

•SiC

NOTE All test definitions are just sample. If the samples damage your devices, Agilent

Technologies is NOT LIABLE for the damage.

NOTE If you delete a test definition

Application library should be recovered. Import the test definition by using the

Import Test Definition... function of the Library button. The original test definitions

are stored in the following folders.

<program folder>\Agilent\B1500\EasyEXPERT\Application Tests

<program folder>\Agilent\B1500\EasyEXPERT\Contribution\Application Tests

NOTE Note 1

These test definitions belong to the categories PMIC, PowerMOSFET, and SiC.

NOTE Note 2

This test definition belongs to the categories IGBT, MISCAP, PMIC,

PowerMOSFET, and SiC.

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Agilent Technologies EasyEXPERT Guide de l'utilisateur Page 80