Agilent Technologies B1500A Guide de l'utilisateur Page 480

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9-6 Agilent B1500 User’s Guide, Edition 7
If You Have a Problem
When You Perform Measurement
When You Perform Measurement
This section covers the following basic problems that you may encounter when you
making a measurement, and the solutions.
“Measurement Takes More Time than Specified”
“Noise Affects the Measured Values”
“Voltage Measurement Error is Large”
“SMU Oscillates for High-Frequency Device Measurements”
“SMU Oscillates for Negative Resistance Measurements
“Large Current Causes High Temperature (Thermal Drift)”
“Measurement Damages the Device under Test”
“Leaving Connections Damages Devices after Measurement”
“Unexpected Sampling Measurement Data is Returned”
“MFCMU Causes Unbalance Condition”
Measurement Takes More Time than Specified
If you set many measurement channels, auto ranging mode, or too long integration
time, measurement takes a longer time.
To solve this problem:
Depending on your measurement requirements, perform following:
Decreases measurement channels.
Uses limited auto ranging mode.
Uses fixed range.
Decreases averaging samples of the high-speed A/D converter.
Decreases integration time of the high-resolution A/D converter.
Disables the ADC zero function.
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