Agilent Technologies EasyEXPERT Guide de l'utilisateur télécharger pdf (Page 132)

9-6 Agilent EasyEXPERT User’s Guide Vol. 2, Edition 1

If You Have a Problem

When You Perform Measurement

This section covers the following basic problems that you may encounter when you

making a measurement, and the solutions.

• “Measurement Takes More Time than Specified”

• “Noise Affects the Measured Values”

• “Voltage Measurement Error is Large”

• “SMU Oscillates for High-Frequency Device Measurements”

• “SMU Oscillates for Negative Resistance Measurements”

• “Large Current Causes High Temperature (Thermal Drift)”

• “Measurement Damages the Device under Test”

• “Leaving Connections Damages Devices after Measurement”

• “Unexpected Sampling Measurement Data is Returned”

• “MFCMU Causes Unbalance Condition”

Measurement Takes More Time than Specified

If you set many measurement channels, auto ranging mode, or too long integration

time, measurement takes a longer time.

To solve this problem:

Depending on your measurement requirements, perform following:

• Decreases measurement channels.

• Uses limited auto ranging mode.

• Uses fixed range.

• Decreases averaging samples of the high-speed A/D converter.

• Decreases integration time of the high-resolution A/D converter.

• Disables the ADC zero function.

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Agilent Technologies EasyEXPERT Guide de l'utilisateur Page 132