Agilent Technologies HP 8566B Spécifications Page 74

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12. Noise Sidebands Test
12.
Noise
Sidebands
‘lkst
Related
Adjustments
Specification
Description
100 MHz Voltage-Controlled Crystal Oscillator Adjustments
Sweep, DAC, and Main Coil Driver Adjustments
M/N Loop Adjustments
RF Module Phase Lock Adjustments
YTO Loop Adjustments
20/30
Phase Lock Adjustments
For Frequency Span
125
kHz
(except 100
kHz
offset) and Center
Frequencies from 100 Hz to 5.8
GHz:
Offset from Carrier Sideband Level
(dBc/Hz)
320 Hz
-80
1
kHz
-85
10
kHz
-90
100
kHz
-105
A 5.7
GHz
signal with low phase noise is input to the spectrum
analyzer. The signal and noise sidebands are displayed on the analyzer
and the trace is video-averaged. The displayed noise sideband level
at various frequency offsets is measured and the measured values are
corrected for log amplification and detection errors, then normalized
to a 1 Hz bandwidth. A second HP
8566A/B
Spectrum Analyzer is
used as the signal source for this test. Therefore, if the measured
values are not within specification limits, either analyzer may be at
fault.
Performance Tests 2-49
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